Invited Speakers
<Combining DFT, (S)TEM, dynamical diffraction and EELS>
- Kenji Tsuda (Tohoku University) “Electrostatic potential analysis of ferroelectrics using convergent-beam electron diffraction”
- Naoya Shibata (University Tokyo) “Oxide interface characterization by atomic-resolution field imaging STEM”
- Athanasios Galanis (Nanomegas) “Structure analysis by TEM precession electron diffraction: model building with different ED data collection strategies”
- Mark Oxley (Vanderbilt University) “The Influence of dynamical diffraction on STEM-EELS fine structure”
- Cecile Hebert (EPFL) “Angular resolved low loss EELS of Ag acquired in EFTEM mode”
<Defects and interfaces>
- Daniel Caillard (CEMES-CNRS) “An in situ study of dislocation kinetics in Fe and Fe alloys at low temperatures”
- Maria Valera (Oakridge National Laboratory) “Probing magnetism at high spatial resolution by aberration corrected electron microscopy and spectroscopy”
- Haruyuki Inui (Kyoto University) “Crystal structure and deformation of long period stacking ordered intermetallic phases in the Mg-Al-Gd systems”
- Xiaoou Yi (Oxford University) “In-situ transmission electron microscope observations of radiation damage effects in tungsten compared with iron”
<Real-time observations and simulations>
- Bryan Reed (Lawrence Livermore National Laboratory) “Movie mode DTEM”
- Yifeng Liao (Northwestern University) “In-situ Nanotribology in Full View”
- Yoshifumi Oshima (Osaka University) “Electrical and mechanical properties of ballistic gold nanocontacts measured by in-situ TEM observation”
- Sergei Dudarev (UK Atomic Energy Authority) “The fundamental role of electron microscopy in the development of new nuclear materials”