Program
<Combining DFT, (S)TEM, dynamical diffraction and EELS>
EELS/DFT, Charge imaging by CBED/DFT, Field imaging by other techniques, Structure analysis by precession diffraction/DFT, etc.
<Defects and interfaces>
Deformation processes, Interface structure and dynamics, Radiation effects, etc.
<Phase transformation>
Experiments on nucleation and growth dynamics, Modeling phase transformation kinetics, etc.
<Real-time observations and simulations>
Ultrafast electron microscopy techniques, In-situ, environmental microscopy techniques, Real-time simulations of in-situ TEM, etc.
*The program can be downloaded here.