Scope, Topics & Sessions


Electron Microscopy and Multiscale Modeling (EMMM) is an interdisciplinary conference bringing together experts from several areas of modern electron microscopy, crystallography, and materials science. It will focus on the link between methods of interrogating structures at the nano- and meso-scale using electron microscopy and diffraction, and the rapidly expanding field of multiscale materials modeling. It is a follow-up of the successful EMMM conferences held in Moscow in 2007, Zurich in 2009, Tahoe (California) in 2011.


  1. Methods and techniques for direct visualisation and electron diffraction imaging of structures on nano-, meso- and macro-scale, application of these methods to the investigation of dynamical processes in materials in the bulk and on surfaces of materials, the structure and dynamical properties of defects, and high-resolution spectroscopy techniques.
  2. Density functional and related ab-initio approaches to modelling bulk and surface structures, and quantitative interpretation of electron diffraction patterns, high resolution electron energy loss spectra, as well as information obtained using other quantitative methods for the determination of structure and electron charge density.
  3. The structure and dynamics of defects, dislocations and grain boundaries, methods of direct imaging of defects, dislocations and grain boundaries, as well as other diffraction and related techniques, for example X-ray and neutron diffraction, and surface tunnelling microscopy and spectroscopy.
  4. Methods based on in-situ mechanical deformation, and other techniques for in-situ modification of properties of materials, combined with modelling methods and approaches to the quantitative interpretation of in-situ observations.
  5. Applications of the above techniques to practical problems of materials science related to advanced power generation, combating climate change, and security of energy supply.

Program Sessions

<Combining DFT, (S)TEM, dynamical diffraction and EELS>
EELS/DFT, Charge imaging by CBED/DFT, Field imaging by other techniques, Structure analysis by precession diffraction/DFT, etc.

<Defects and interfaces>
Deformation processes, Interface structure and dynamics, Radiation effects, etc.

<Phase transformation>
Experiments on nucleation and growth dynamics, Modeling phase transformation kinetics, etc.

<Real-time observations and simulations>
Ultrafast electron microscopy techniques, In-situ, environmental microscopy techniques, Real-time simulations of in-situ TEM, etc.